Refractive index and dispersion measurement using low-coherence interferometry with broadband confocal scanning
Measurement of the refractive index and thickness of transparent plates is demonstrated using com... more Measurement of the refractive index and thickness of transparent plates is demonstrated using combined low-coherence interferometry and confocal scanning. The low-coherence measurement provides a quantity related to the group index and the confocal scan provides a parameter related to the phase index. Calculation of both the phase and group indices also requires a measurement of the confocal parameter at multiple wavelengths. This is achieved using a broadband source and a line-scan spectrometer to interrogate different regions of the spectrum. Measurements are made on a range of transparent optical materials with the mean percentage errors of each measurand being 0.08%, 0.06%, and 0.12% for np, ng, and thickness t respectively.
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Papers by francis daniel