Transient current testing based on current (charge) integration
IDDQ Testing, 1998. …, Jan 1, 1998
Abstract We evaluated a technique that uses power supply charge as the test observable. Charge wa... more Abstract We evaluated a technique that uses power supply charge as the test observable. Charge was computed from the measured supply transient current waveform. Data show that this method is efficient to detect those defects that prevent current elevation (mainly “hard” opens) and therefore represents a valid extension of I DDQ
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Papers by Ivan de Paul